http://www-hrem.msm.cam.ac.uk/~cbb/publications/emag99lorentz/
Presented at: EMAG 99, Sheffield, 25-27 August 1999
Published in: Electron microscopy and analysis 1999, ed C Kiely,
Inst Phys conf ser no. 161 (IOPP, Bristol, 1999) p 283-286
The direct determination of magnetic induction maps from Lorentz images
C B Boothroyd and R E Dunin-Borkowski
1
Department
of Materials Science, University of Cambridge, Pembroke St, Cambridge CB2 3QZ
1Department
of Materials, University of Oxford, Parks Road, Oxford OX1 3PH
ABSTRACT:
Lorentz microscopy is a simple method by which the domain walls of magnetic
materials can be made visible in a qualitative fashion. Here we describe a
method whereby the magnitude and direction of magnetisation can be obtained
from Lorentz images quantitatively, using NdFeB and Co as examples.
1. INTRODUCTION
Out-of-focus
(or Lorentz) images of magnetic materials contain contrast from domain walls
and magnetisation ripple and can be very difficult to interpret intuitively
(Cohen, 1967). As a result, vector maps of magnetisation distributions in
materials are usually determined using more specialised techniques such as
off-axis electron holography (Tonomura, 1992) and differential phase contrast
microscopy (Chapman, 1984). Here, we illustrate how two-dimensional
magnetisation distributions
can
in fact be determined from Lorentz images directly. Our approach relies on the
fact that in the absence of dynamical effects the intensity of a Lorentz image
can be written
I(x) approx= 1 - (f
[lambda]/2[pi])(d2[phi](x)/dx2)
+ ... (1)
where
f is the defocus,
[lambda]
is the electron wavelength and x is a distance in the plane of the sample
(Cowley, 1995). Assuming that neither the mean inner potential V(x) nor the
in-plane component of the magnetic induction B
||(x)
vary in the beam direction, the electron phase
[phi](x)
= C
EV(x)t(x)
- (
2[pi]e/h)
[integral]B
||(x)t(x)dx)
(2)
where
t(x) is the sample thickness and C
E
is an energy-dependent constant (Dunin-Borkowski et al., 1998).
[phi](x)
can be recovered by integrating I(x) twice, which is best done in Fourier
space. B
||(x)
can then be determined from
[phi](x).
This approach is also the basis of an algorithm for recovering phases in light
optics by Paganin and Nugent (1998). Experimental complications include the
presence of variations in mean inner potential and amplitude (or absorption)
contrast associated with sample thickness and dynamical diffraction effects. In
practice, many of these artefacts can be removed by subtracting or dividing
each Lorentz image by an in-focus image. The approach also necessarily enhances
the low frequencies in the image, which means that any slight variations in
background intensity due to thickness variations or bend contours are greatly
amplified. This means that some high pass filtering of the image may be
required. This filter has to be chosen with care to avoid removing information
on the scale of the domain structure being observed. A further complication is
that the average gradient of the phase is lost as this is determined by
contrast outside the region analysed.
Fig. 1a
shows a test structure containing 4 magnetic domains. The electron phase is
shown in fig 1b, and simulated images for defocus values of
-20 µm, 0 and +20 µm are shown in fig. 1c for
200 kV and CS=8 m.
There is very little contrast at focus, while the over and under focus images
are approximately reversed in contrast. Fig. 1d shows the phase recovered
from the -20 µm defocus image using equations (1) and (2). The
recovered phase is very similar to the input phase in fig. 1b, although
the resolution is slightly lower.
Fig. 1. a) Test
structure with arrows showing magnetisation directions; b) electron phase;
c) simulated under, at and over focus images of test structure;
d) recovered phase from the image at -20 µm defocus;
e) x & y components of magnetisation calculated from recovered phase,
with arrows showing direction on x component.
2. Nd2Fe14B
Fig. 2a
shows a Lorentz image of a Nd
2Fe
14B
alloy, in which the intensity variation with specimen thickness can be treated
by dividing by an in-focus image. (The Fresnel fringe at the sample edge cannot
be removed in this way). The x and y components of the magnetisation, obtained
by differentiating the recovered phase (fig. 2b) in the x and y directions, are
shown in fig. 2c. A comparison with the magnetisation measured using
holography (arrows on right image of fig. 2c) shows that the magnitude and
direction of the magnetisation are recovered well. Small errors result mainly
from the amplification of low frequency noise.
Fig. 2.
a) original image; b) recovered phase from region in box in a;
c) x & y components with arrows on left image from region in box in b.
The arrows on the y component (right) image are the magnetisation from a
hologram of the same area for comparison.
3. Co
films
The
images of thin Co films shown in fig. 3a are in principle easier to
analyse than NdFeB as they are of constant thickness. The magnetic structure is
also on a much finer scale, meaning that more of the low frequency noise can be
filtered out. An example of the recovered magnetisation from a film about to
undergo reversal is shown in fig. 3b.
The
magnetisation of such a film is expected to be solely in-plane. Thus, a
histogram of the x and y components of magnetisation in fig 3b (where distance
from the origin represents the magnitude of the magnetisation and position
represents the direction of magnetisation) forms an arc of a circle centred on
the origin, as shown in fig 3c. However, the origin of the histogram lies on
the brightest part of the arc and not at its centre. This means that the
magnetisation is wrong by a constant amount whose x and y components are given
by the centre of the arc. This magnetisation error corresponds to a constant
phase ramp in the phase image from which fig 3b is derived. The error arises
because only a small region of the specimen was processed, with the image
contrast giving rise to the phase ramp outside the area analysed. The
magnetisation after correcting for the phase ramp is shown on the right in fig
3c.
Fig. 3.
a) Lorentz image of a 15 nm thick Co film within a tunnel junction
(IBM Almaden) with an applied field of
-2.6×10-3 T;
b) x and y components of magnetisation recovered from a) with arrows on
left image. The arrows on the right image show the magnetisation after
correction. c) Histogram of x and y components of magnetisation from b
with the x component horizontally, the y component vertically and the origin in
the middle. Dark means higher frequency and it can be seen that the histogram
forms an arc of a circle.
Histograms
of the magnetisation can be used to give information about the distribution of
magnetic domains in these Co films as the applied magnetic field is changed so
as to take the film through a hysteresis cycle, as shown in fig. 4. When
magnetised fully in one direction (fig. 4a) most of the domains are aligned
with a small amount of spread. As a reverse field is applied the spread in
domain alignment becomes larger as shown by the enlargement of the arc in fig
4b. At a large enough field the magnetisation reverses, as shown partially
complete in fig. 4c and complete in fig. 4d. If the applied field is reversed
again then the cycle repeats in the opposite direction (figs. 4e & f). For
fig. 4c the magnetisation reversal between the top left and bottom right is on
too large a scale to be reconstructed properly so the resulting histogram can
no longer be interpreted easily.
Fig. 4.
Lorentz images and histograms of the magnetisation direction (as in
fig. 3) as the Co film is taken through a hysteresis cycle. The field
applied for each image is: a) 0, b) -2.6×10-3,
c) -2.8×10-3,
d) -6.7×10-3,
e) +2.9×10-3,
and f) +3.2×10-3 T.
Note that the magnetisation in c) is not recovered properly as there is a
reversal of magnetisation across the image on a scale larger than the area of
the image, thus making the corresponding histogram difficult to interpret.
4. Conclusion
The
magnitude and direction of the magnetisation in a material can be recovered
quantitatively from a Lorentz image knowing only the magnification, defocus and
thickness. Although the method suffers from artefacts at low frequencies, it
allows large areas away from the sample edge to be analysed rapidly and
directly. We thank M.R. McCartney and D.J. Smith for discussions and
for the NdFeB holography result. The images were obtained at the Center for
High-Resolution Electron Microscopy at Arizona State University.
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