Amorphous metal diffusion barriers for semiconductor contacts University of Cambridge, 1986 |
1 |
TEM observations of metallic glass contacts on GaAs Electron Microscopy and Analysis 1983, ed P Doig, Inst. Phys. Conf. Ser. no. 68 (IOP, Bristol, 1983) p 441-444 |
2 |
Fresnel effects at grain boundary dislocations Phil Mag A 49 (1984) p L5-L8 (DOI: 10.1080/01418618408233438) |
3 |
Specimen preparation methods for the examination of surfaces and interfaces in the transmission electron microscope J Microsc 140 (1985) p 195-207 |
4 |
Tantalum-iridium Schottky barrier contacts on gallium arsenide Electron Microscopy and Analysis 1985, ed G J Tatlock, Inst. Phys. Conf. Ser. no. 78 (Adam Hilger, Bristol, 1985) p 407-410 |
5 |
The measurement of rigid body displacements using Fresnel-fringe intensity methods Phil Mag A 54 (1986) p 663-677 |
6 |
The formation of amorphous interlayers by solid state interdiffusion between Pd-Er and Si Proc 44th EMSA, ed G W Bailey (San Francisco Press, San Francisco, 1986) p 806-807 |
7 |
Negative differential resistance at room temperature from resonant tunneling in GaInAs/InP double barrier heterostructures Electronic letters 23 (1987) p 116-117 |
8 |
Formation of submicron epitaxial islands of Pd2Si on silicon Appl Phys Lett 50 (1987) p 577-579 |
9 |
Methods for the assessment of layer orientation, interface step structure and chemical composition in GaAs/(Al,Ga)As multilayers Microscopy of Semiconducting Materials 1987, ed AG Cullis, Inst. Phys. Conf. Ser. no. 87 (Adam Hilger, Bristol, 1987) p 195-200 |
10 |
The simultaneous retention of resolution and layer contrast in high resolution images of GaAs/(Al,Ga)As heterostructures Microscopy of Semiconducting Materials 1987, ed AG Cullis, Inst. Phys. Conf. Ser. no. 87 (Adam Hilger, Bristol, 1987) p 15-20 |
11 |
Ion and electron-beam induced reactions in microcrystalline Pd3Er Scripta Met 21 (1987) p 1285-1288 |
12 |
The effects of contributions from energy loss electrons to "centre-stop" high resolution images of (Al,Ga)As/GaAs interfaces Electron Microscopy and Analysis 1987, ed LM Brown, Inst. Phys. Conf. Ser. no. 90 (Adam Hilger, Bristol, 1988) p 237-240 |
13 |
High quality GaAs/Ga.49In.51P superlattices grown on GaAs and silicon substrates by low-pressure metalorganic chemical vapor deposition J Appl Phys 63 no 9 (1 May 1988) p 4511-4514 (DOI: 10.1063/1.340147) |
14 |
The contribution of inelastically scattered electrons to high resolution images of (Al,Ga)As/GaAs heterostructures Ultramicroscopy 26 (1988) p 361-376 (DOI: 10.1016/0304-3991(88)90235-5) |
15 |
The promotion of silicide formation using a scanned silicon ion beam Presented at: MRS conference, Boston, December 1987 Published in: Fundamentals of beam-solid interactions and transient thermal processing, ed MJ Aziz, LE Rehn and B Stritzker, MRS symposium proceedings vol 100 (MRS, Pittsburgh, 1988) p ? |
16 |
The determination of the structure and composition at interfaces to atomic resolution Presented at: Frontiers of electron microscopy in materials science: surfaces and interfaces, Oak Brook, Illinois, USA, May 1988 Published in: Ultramicroscopy 29 (1989) p 18-30 (DOI: 10.1016/0304-3991(89)90227-1) |
17 |
Developments in TEM techniques for the characterisation of semiconductor superlattices and heterostructures Presented at: Microscopy of Semiconducting Materials, Oxford, 10-13 April 1989 Published in: Microscopy of Semiconducting Materials 1989, ed AG Cullis and JL Hutchinson, Inst. Phys. Conf. Ser. no. 100 (Institute of Physics, Bristol, 1989) p 271-280 |
18 |
The contribution of inelastically scattered electrons to [110] high resolution images of GaAs/AlAs heterostructures Ultramicroscopy 31 (1989) p 259-274 (DOI: 10.1016/0304-3991(89)90049-1) |
19 |
The appropriateness of current three dimensional refinements for multislice simulations Presented at: EMAG/MICRO, London, 12-15 September 1989 Published in: Electron Microscopy and Analysis 1989, ed PJ Goodhew and HY Elder, Inst. Phys. Conf. Ser. no. 98 (Institute of Physics, Bristol, 1989) p 387-390 |
20 |
Comments on the limitations of the chemical mapping of a III-V semiconductor interface using high resolution lattice imaging Presented at: EMAG/MICRO, London, 12-15 September 1989 Published in: Electron Microscopy and Analysis 1989, ed PJ Goodhew and HY Elder, Inst. Phys. Conf. Ser. no. 98 (Institute of Physics, Bristol, 1989) p 345-348 |
21 |
The detection of 0.5at% boron in Ni3Al using parallel energy loss spectroscopy Presented at: XIIth International Congress for Electron Microscopy, Seattle, Washington, USA, 12-18 Aug 1990 Published in: Proceedings of the XIIth international congress for electron microscopy, ed LD Peachey and DB Williams (San Francisco Press, San Francisco, 1990) p 80-81 |
22 |
Approaches for energy loss and energy filtered imaging in TEM in relation to the materials problems to be solved Presented at: Lake Tahoe Workshop on Electron Energy Loss Spectroscopy, Tahoe City, California, USA, 17-22 Aug 1990 Published in: Microscopy, Microanalysis and Microstructures 2 no 2-3 (1991) p 333-350 |
23 |
Direct measurement of the temperature dependence of the unperturbed dimensions of a polymer Europhysics Letters 15 no 7 (1991) p 715-719 |
24 |
Electron beam damage in AlF3 Presented at: EMAG 91, Bristol, 11-13 September 1991 Published in: Electron microscopy and analysis 1991, ed FJ Humphreys, Inst of Phys Conf Ser no 119 (IOP, Bristol, 1991) p 325-328 |
25 |
Quantification of nitrogen in solution in stainless steels using parallel EELS Materials Transactions, JIM 33 no 6 (June 1992) p 571-576 |
26 |
Direct measurement of the 3-body interaction amplitude in a dilute polymer solution Phys Rev Lett 69 no 3 (20 July 1992) p 426-429 |
27 |
Pattern fabrication and mechanisms of direct electron beam nanolithography in silicon dioxide Presented at: EUREM 92, Granada, Spain, 7-11 September 1992 Published in: Electron microscopy 92, ed A Ríos, JM Arias, L Megías and A López-Galindo (Secretariado de Publicaciones de la Universidad de Granada, Granada, Spain, 1992) p ? |
28 |
Novel fabrication method for nanometer-scale silicon dots and wires Applied Physics Letters 62 no 16 (19 April 1993) p 1949-1951 |
29 |
Ultimate limits of lithography Physics World 5 no 11 (Nov 1992) p 28-32 |
30 |
Measuring the height of steps on MgO using Fresnel contrast in a scanning transmission electron microscope Presented at: Aspects of electron microscopy, diffraction, crystallography and spectroscopy, Scottsdale, Arizona, USA, 5-8 January 1993 Published in: Ultramicroscopy 52 (1993) p 318-324 |
31 |
Direct electron beam fabrication of nanometre scale silicon columns Presented at: Microscopy of Semiconducting Materials, Oxford, 5-8 April 1993 Published in: Microscopy of Semiconducting Materials 1993, ed AG Cullis, AE Staton-Bevan and JL Hutchison, Inst. Phys. Conf. Ser. no. 134 (Institute of Physics, Bristol, 1993) p 503-508 |
32 |
Microstructure of a γ-α2-β Ti-Al alloy containing iron and vanadium Acta Met 41 no 10 (1993) p 2867-2876 |
33 |
Boron segregation in a (Fe,V,B)TiAl/Ti3Al alloy Presented at: Euromat 93, 3rd European Conference on Advanced Materials and Processes, Paris, 8-10 June 1993 Published in: Journal de Physique IV 3 (Nov 1993) p 397-402 |
34 |
B2/Ti11Ni14 interface on R-phase transformation Presented at: International union of materials research society - international conference in Asia, Wuhan, Chongqing, 6-10 September 1993 Published in: Proceedings of international union of materials research society - international conference in Asia, ed ?, p434-439 |
35 |
The orientation dependence of the Cu L loss as assessed by PEELS for YBa2Cu3O7-d Presented at: EMAG 93, Liverpool, 14-17 September 1993 Published in: Electron microscopy and analysis 1993, ed AJ Craven, Inst of Phys Conf Ser no 138 (Insitute of Physics, Bristol, 1993) p 43-46 |
36 |
Electron induced crystallisation in aluminium trifluoride Presented at: EMAG 93, Liverpool, 14-17 September 1993 Published in: Electron microscopy and analysis 1993, ed AJ Craven, Inst of Phys Conf Ser no 138 (Insitute of Physics, Bristol, 1993) p 369-372 |
37 |
Interfacial composition at Ti3Ni4/matrix interfaces in a Ti-Ni SMA measured using EDXS in a STEM Presented at: 5th Beijing conference and exhibition on instrumental analysis, Beijing, China, 9-12 October 1993 Published in: Proceedings of the international fifth Beijing conference and exhibition on instrumental analysis, ed Sun Dezhong (Peking University Press, Beijing, 1993) p A107-A108 |
38 |
Boride morphology in a (Fe, V, B) Ti-Al alloy containing β2-phase Acta metall mater 43 no 4 (1995) 1429-1438 |
39 |
Interpretation of the {100} fringes in lattice images from the centre of carbon nanotubes Ultramicroscopy 56 (1994) 127-134 |
40 |
Electron beam damage of atomically flat {0001} a-alumina Presented at: ICEM 13, Paris, 17-22 July 1994 Published in: Electron Microscopy 1994, ed B Jouffrey and C Colliex (Les Editions de Physique, Les Ulis, 1994) p 1045-1046 |
41 |
The effect of thin crystal strain relaxation on high resolution images of Si/Si0.8Ge0.2 quantum wells Presented at: ICEM 13, Paris, 17-22 July 1994 Published in: Electron Microscopy 1994, ed B Jouffrey and C Colliex (Les Editions de Physique, Les Ulis, 1994) p 365-366 |
42 |
An imaging filter for a 100kV dedicated STEM Presented at: ICEM 13, Paris, 17-22 July 1994 Published in: Electron Microscopy 1994, ed B Jouffrey and C Colliex (Les Editions de Physique, Les Ulis, 1994) p 167-168 |
43 |
Momentum dependent energy loss near edge structures using a CTEM: the reliability of the methods available Presented at: EELSI 94, Leukerbad, Switzerland, 24-28 July 1994 Ultramicroscopy 59 no 1-4 (July 1995) 93-107 |
44 |
Measurement of TEM primary energy with an electron energy-loss spectrometer Presented at: EELSI 94, Leukerbad, Switzerland, 24-28 July 1994 Ultramicroscopy 59 no 1-4 (July 1995) 283-285 |
45 |
Quantifying the effects of amorphous layers on image contrast using energy filtered transmission electron microscopy Presented at: MRS fall meeting, Boston, 28 Nov-2 Dec 1994 Published in: Beam-solid interactions for materials synthesis and characterization, ed Dale C Jacobson, David E Luzzi, Tony F Heinz and Masaya Iwaki, MRS Symposium Proceedings vol 354 (MRS, Pittsburgh, 1995) p 495-500 |
46 |
HREM lattice image simulations of circular cross-sectional multishell carbon nanotubes Presented at: MRS fall meeting, Boston, 28 Nov-2 Dec 1994 Published in: Science and technology of fullerene materials, ed P Bernier, T W Ebbesen, DS Bethune, RM Metzger, LY Chiang and JW Mintmire, MRS symposium proceedings vol 359 (MRS, Pittsburgh, 1995) p ? |
47 |
Energy-filtered Fresnel contrast analysis of Fe/Cu multilayers Presented at: CMMP 94, Warwick, 19-21 Dec 1994 Published in: J Microsc 180 no 3 (Dec 1995) p 263-276 |
48 |
Strain relaxation induced local crystal tilts at Si/SiGe interfaces in cross-sectional transmission electron microscope specimens Presented at: Microscopy of Semiconducting Materials, Oxford, 20-23 March 1995 Published in: Microscopy of Semiconducting Materials 1995, ed AG Cullis and
AE Staton-Bevan, Inst of Phys Conf Ser no. 146 (Institute of Physics, Bristol,
1995) p 11-16 |
49 |
The microstructure of MnSb grown on (001) GaAs by hot wall epitaxy Journal of Crystal Growth 156 (1995) 155-162 |
50 |
The determination of absorption parameters in Si and GaAs using energy-filtered imaging Presented at: EMAG 95, Birmingham, 12-15 September 1995 Published in: Electron microscopy and analysis 1995, ed D Cherns, Inst Phys conf ser no 147 (IOPP, Bristol, 1995) p 179-182 |
51 |
The role of plasmon scattering in the quantitative contrast analysis of high-resolution lattice images of GaAs Presented at: EMAG 95, Birmingham, 12-15 September 1995 Published in: Electron microscopy and analysis 1995, ed D Cherns, Inst Phys conf ser no 147 (IOPP, Bristol, 1995) p 195-198 |
52 |
Electron beam nanolithography of FeF3 using a scanning transmission electron microscope Presented at: EMAG 95, Birmingham, 12-15 September 1995 Published in: Electron microscopy and analysis 1995, ed D Cherns, Inst Phys conf ser no 147 (IOPP, Bristol, 1995) p 325-328 |
53 |
A comparative study of electron beam damage in crystalline and amorphous aluminium oxide Presented at: EMAG 95, Birmingham, 12-15 September 1995 Published in: Electron microscopy and analysis 1995, ed D Cherns, Inst Phys conf ser no 147 (IOPP, Bristol, 1995) p 567-570 |
54 |
Artefacts within ion beam milled semiconductors Presented at: EMAG 95, Birmingham, 12-15 September 1995 Published in: Electron microscopy and analysis 1995, ed D Cherns, Inst Phys conf ser no 147 (IOPP, Bristol, 1995) p 393-396 |
55 |
The B2->α2 transformation in an industrial γ+α2+B2 TiAl alloy Presented at: EMAG 95, Birmingham, 12-15 September 1995 Published in: Electron microscopy and analysis 1995, ed D Cherns, Inst Phys conf ser no 147 (IOPP, Bristol, 1995) p 543-546 |
56 |
Electron beam induced crystallisation in iron (III) fluoride Presented at: MRS fall meeting, Boston, 27 Nov-1 Dec 1995 Published in: Thermodynamics and kinetics of phase transformations, ed JS Im, B Park, AL Greer and GB Stephenson, MRS symposium proceedings vol 398 (MRS, Pittsburgh, 1996) p 195-200 |
57 |
Fresnel contrast analysis of composition changes and space charge at grain boundaries in Mullite Ultramicroscopy 66 no 1-2 (Nov 1996) 59-71 |
58 |
Quantification of energy filtered lattice images and coherent convergent beam patterns Presented at: Fifteenth Pfefferkorn conference on electron image and signal processing, Silver Bay, New York, 18-22 May 1996 |
59 |
Transition metal impurities, compositional fluctuations and electrical activity within MBE grown Si/SiGe/Si(001) Presented at: XI European Congress on Microscopy, Dublin, 26-30 August 1996 Published in: Electron Microscopy 96, vol 2, ed Committee of European Societies of Microscopy (Committee of European Societies of Microscopy, Brussels, 1998) p 258-259 |
60 |
The dependence of the growth rate of LPCVD grown SiGe quantum wells on the Ge composition and the layer thickness Presented at: XI European Congress on Microscopy, Dublin, 26-30 August 1996 Published in: Electron Microscopy 96, vol 1, ed Committee of European Societies of Microscopy (Committee of European Societies of Microscopy, Brussels, 1998) p 317-318 |
61 |
Presented at: XI European Congress on Microscopy, Dublin, 26-30 August 1996 Published in: Electron Microscopy 96, vol 2, ed Committee of European Societies of Microscopy (Committee of European Societies of Microscopy, Brussels, 1998) p 123-124 |
62 |
Modelling EELS detection limits Presented at: XI European Congress on Microscopy, Dublin, 26-30 August 1996 Published in: Electron Microscopy 96, vol 1, ed Committee of European Societies of Microscopy (Committee of European Societies of Microscopy, Brussels, 1998) p 295-296 |
63 |
The effect of Ti3Ni4 precipitates in TiNi alloys Presented at: 6th Asia Pacific conference on electron microscopy, Hong Kong, 1-5 July 1996 Published in: Proceedings of the sixth Asia-Pacific conference on electron microscopy, ed D Barber, PY Chan, EC Chew, JS Dixon and JUL Lai (Chineteu Promotion Services, Hong Kong, 1996) p 279-280 |
64 |
Electron-beam induced crystallization transition in self-developing amorphous AlF3 resists Applied Physics Letters 69 no 2 (8 July 1996) 170-172 |
65 |
TEM and PL characterisation of MBE-grown epitaxial GaN/GaAs Presented at: MRS spring meeting, San Francisco Published in: III-nitride, SiC and diamond materials for electronic devices, ed DK Gaskill, CD Brandt and RJ Nemanich, MRS symposium proceedings vol 423 (MRS, Pittsburgh, 1996) p311-316 |
66 |
Presented at: MRS fall meeting, Boston, 2-6 Dec 1996 Published in: Atomic resolution microscopy of surfaces and interfaces, ed DJ Smith and RJ Hamers, MRS symposium proceedings vol 466 (MRS, Pittsburgh, 1997) p113-118 |
67 |
Electrostatic potentials at θ=24° [001] tilt boundaries in undoped and doped strontium titanate bicrystals Presented at: MRS fall meeting, Boston, 2-6 Dec 1996 Published in: Interfacial engineering for optimized properties, ed CL Briant, CB Carter and EL Hall, MRS symposium proceedings vol 458 (MRS, Pittsburgh, 1997) p 109-114 |
68 |
Characterization of ultrathin doping layers in semiconductors Presented at: Atomic Structure and Chemistry of Interfaces Workshop, Tempe, Arizona, 8-11 January 1997 Published in: Microscopy and Microanalysis 3 no 4 (1997) 352-363 |
69 |
Probing the effect of defects on band structure in GaN abstract to: Microscopy of semiconducting materials X, Oxford, 7-10 April 1997 Published in: Microscopy of semiconducting materials, ed AG Cullis and JL Hutchinson, Inst Phys conf ser no 157 (IOPP, Bristol, 1997) p 217-220 |
70 |
The characterisation of ultrathin doping layers in semiconductors using high-angle annular dark-field imaging abstract to: Microscopy of semiconducting materials X, Oxford, 7-10 April 1997 Published in: Microscopy of semiconducting materials, ed AG Cullis and JL Hutchinson, Inst Phys conf ser no 157 (IOPP, Bristol, 1997) p 67-70 |
71 |
The effects of surface relaxation and ion thinning on [delta]-doped semiconductor cross-sections Presented at: Microscopy of semiconducting materials X, Oxford, 7-10 April 1997 Published in: Microscopy of semiconducting materials, ed AG Cullis and JL Hutchinson, Inst Phys conf ser no 157 (IOPP, Bristol, 1997) p 483-486 |
72 |
A grain boundary study of the aluminium oxide formed on MA956 of different yttria contents Presented at: Microscopy of oxidation 3, Cambridge, 16-18 September 1996 Published in: Microscopy of oxidation 3, proceedings of the third international conference on the microscopy of oxidation, ed SB Newcomb and JA Little, (Institute of Materials, London, 1997) p 166-176 |
73 |
Why don't high resolution simulations and images match? Presented at: Image analysis methods in quantitative electron microscopy, Schloß Ringberg, Rottach-Egern, Germany, 9-14 March 1997 Published in: J Microscopy 190 pt 1/2 (April/May 1998) 99-108 (DOI: 10.1046/j.1365-2818.1998.2910843.x) |
74 |
Direct measurement and interpretation of electrostatic potentials at 24° [001] tilt boundaries in undoped and niobium-doped strontium titanate bicrystals Published in: J American Ceramics Society 81 no 11 (1998) 2917-2926 |
75 |
The determination of the ionicity of sapphire using energy-filtered high resolution electron microscopy Presented at: EMAG 97, Cambridge, 2-5 September 1997 Published in: Electron microscopy and analysis 1997, ed JM Rodenburg, Inst Phys conf ser no 153 (IOPP, Bristol, 1997) p 113-116 |
76 |
An investigation of the 'omega-phase' in Ni-rich Ni-Al Presented at: EMAG 97, Cambridge, 2-5 September 1997 Published in: Electron microscopy and analysis 1997, ed JM Rodenburg, Inst Phys conf ser no 153 (IOPP, Bristol, 1997) p 577-580 |
77 |
Grain-boundary segregation of Ho in BaTiO3 Presented at: EMAG 97, Cambridge, 2-5 September 1997 Published in: Electron microscopy and analysis 1997, ed JM Rodenburg, Inst Phys conf ser no 153 (IOPP, Bristol, 1997) p 507-510 |
78 |
Electron beam damage in titanium dioxide films Presented at: EMAG 97, Cambridge, 2-5 September 1997 Published in: Electron microscopy and analysis 1997, ed JM Rodenburg, Inst Phys conf ser no 153 (IOPP, Bristol, 1997) p 167-170 |
79 |
The compton scattering distribution from InP by electron spectroscopic diffraction Presented at: International centennial symposium on the electron, Cambridge, 15-17 September 1997 Published in: The electron, ed Angus Kirkland and Paul D Brown, (IOM Communications Ltd, London, 1998) p 456-463 |
80 |
Irradiation damage of inorganic resists on a silicon substrate Presented at: International centennial symposium on the electron, Cambridge, 15-17 September 1997 Published in: The electron, ed Angus Kirkland and Paul D Brown, (IOM Communications Ltd, London, 1998) p 531-537 |
81 |
Energy-filtered transmission electron microscopy of multilayers in semiconductors Presented at: MRS Spring Meeting, San Francisco, 13-17 April 1998 Published in: Electron microscopy of semiconducting materials and ULSI devices, ed C Hayzelden, FM Ross and CJD Hetherington, MRS symposium proceedings vol 523 (MRS, Pittsburgh, 1998) p 159-164 |
82 |
Electron-beam-induced damage in amorphous SiO2 and the direct fabrication of silicon nanostructures Phil Mag A 78 no 2 (August 1998) 491-506 |
83 |
Quantitative analysis of ultrathin doping layers in semiconductors using high angle annular dark field images Presented at: Frontiers of electron microscopy in materials science 1998, quantitative methods in transmission electron microscopy, Kloster Irsee, Germany, 19-24 April 1998 Published in: J Microscopy 194 pt 1 (April 1999) 171-182 |
84 |
Energy-filtered transmission electron microscopy of multilayers in semiconductors Presented at: Frontiers of electron microscopy in materials science 1998, quantitative methods in transmission electron microscopy, Kloster Irsee, Germany, 19-24 April 1998 Published in: J Microscopy 194 pt 1 (April 1999) 58-70 |
85 |
Measurement of grain boundary potential in undoped and Ho-doped BaTiO3 Submitted to: 14th International Congress on Electron Microscopy, Cancun, Mexico, 31 August to 4 September 1998 Published in: Electron microscopy 1998 vol 2, ed Héctor A Calderón Benavides and Miguel José Yacamán (Institute of Physics, Bristol, 1998) p 663-664 |
86 |
Electron energy loss spectroscopy studies of the amorphous to crystalline transition in FeF3 J Appl Phys 86 no 5 (1 September 1999) 2499-2504 (DOI: 10.1063/1.371083) |
87 |
TEM observation of CMOS devices of titanium self aligned silicide (SALICIDE) technology with Nitrogen (N+) implantation process Journal of Materials Science Letters 18 no 5 (1999) 385-388 |
88 |
Grain refinement by Al-Ti-B alloys in aluminium melts: a study of the mechanisms of poisoning by zirconium Materials Science & Technology 15 no 10 (Oct 1999) 1115-1123 |
89 |
Morphological and structural characteristics of homoepitaxial GaN grown by MOCVD J Crystal Growth 204 no 4 (1999) 419-428 |
90 |
Quantification of high resolution electron microscope images of amorphous carbon Ultramicroscopy 83 no 3-4 (2000) 159-168 |
91 |
Inversion domain nucleation in homoepitaxial GaN Presented at: Microscopy of semiconducting materials XI, Oxford, 22-25 March 1999 Published in: Microscopy of semiconducting materials, ed A Cullis and R Beanland, Inst Phys conf ser no 164 (IOPP, Bristol, 1999) p 381-384 |
92 |
The direct determination of magnetic induction maps from Lorentz images Presented at: EMAG 99, Sheffield, 25-27 August 1999 Published in: Electron microscopy and analysis 1999, ed CJ Kiely, Inst Phys conf ser no 161 (IOPP, Bristol, 1999) p 283-286 |
93 |
Composition of grain boundaries and interfaces: a comparison of modern analytical techniques using a 300 kV FEGTEM Presented at: EMAG 99, Sheffield, 25-27 August 1999 Published in: Electron microscopy and analysis 1999, ed CJ Kiely, Inst Phys conf ser no 161 (IOPP, Bristol, 1999) p 35-38 |
94 |
Can energy filtered Fresnel imaging be used to determine the width of magnetic domain walls? Presented at: EMAG 99, Sheffield, 25-27 August 1999 Published in: Electron microscopy and analysis 1999, ed CJ Kiely, Inst Phys conf ser no 161 (IOPP, Bristol, 1999) p 275-278 |
95 |
EELS of Bloch waves in wedge-shaped crystals Presented at: EMAG 99, Sheffield, 25-27 August 1999 Published in: Electron microscopy and analysis 1999, ed CJ Kiely, Inst Phys conf ser no 161 (IOPP, Bristol, 1999) p 137-140 |
96 |
Evaluation of silicon nitride and silicon carbide as efficient polysilicon grain-growth inhibitors Journal of Materials Science Letters 18 no 17 (1999) 1427-1432 |
97 |
A critical condition in Fresnel diffraction used for ultra-high resolution lithographic printing J Phys D 33 pt 17 (7 September 2000) 2133-2141 |
98 |
Morphology, structure and growth mechanism of WS2 nanotubes Journal of Materials Chemistry 10 pt 11 (June 2000) 2570-2577 (DOI: 10.1039/b004433o) |
99 |
Mixed phase WxMoyCzS2 nanotubes Chem Mater 12 (2000) 3541-3546 |
100 |
Quantification of lattice images: the contribution from diffuse scattering Presented at: FEMMS 2000, Matsue, Japan, 14-17 Nov 2000 Published in: Journal of Electron Microscopy 51 (supplement) (Feb 2002) S279-S287 |
101 |
Tungsten disulphide sheathed carbon nanotubes Chem Phys Chem 2 no 10 (15 Oct 2001) 620-623 |
102 |
WS2 nanotubes containing single-walled carbon nanotube bundles Applied Physics Letters 79 no 27 (31 Dec 2001) 4574-4576 |
103 |
On the high resolution content of elemental maps Presented at: EMAG 2001, Dundee, 5-7 September 2001 Published in: Electron microscopy and analysis 2001, ed M Aindow and CJ Kiely, Inst Phys Conf Ser 168 (IOPP, Bristol, 2001) p 55-58 |
104 |
Transmission electron microscopy of silicon-Pyrex electrostatic bonds Presented at: EMAG 2001, Dundee, 5-7 September 2001 Published in: Electron microscopy and analysis 2001, ed M Aindow and CJ Kiely, Inst Phys Conf Ser 168 (IOPP, Bristol, 2001) p 341-344 |
105 |
Proximity correction simulations in ultra-high resolution X-ray lithography J Phys D 34 no 22 (21 November 2001) 3209-3213 |
106 |
Complex WS2 nanostructures Chemical Physics Letters 359 no 1-2 (13 June 2002) 68-76 |
107 |
Multi-walled carbon nanotubes coated with tungsten disulfide Chem Mater 14 (2002) 2209-2217 |
108 |
Tungsten disulphide coated multi-walled carbon nanotubes Chemical Physics Letters 359 no 1-2 (13 June 2002) 121-126 |
109 |
Crystallization transformations in vacuum-deposited amorphous aluminum fluoride self-developing thin-film resists induced by electron-beam irradiation J Vacuum Science and Technology A 20 no 3 (May/June 2002) 986-990 |
110 |
Synthesis and characterization of carbon nanofibers produced by the floating catalyst method Journal of Phys Chem B 106 (Nov 2002) 10915-10922 |
111 |
The phonon contribution to high-resolution electron microscope images Presented at: SALSA 2002, Guadeloupe, French West Indies, France, 5-9 May 2002 Ultramicroscopy 96 no 3-4 (September 2003) 361-365 (DOI: 10.1016/S0304-3991(03)00101-3) |
112 |
Nitride mediated epitaxy of CoSi2 on Si(001) Applied Physics Letters 82 no 12 (24 March 2003) 1833-1835 (DOI: 10.1063/1.1555708) |
113 |
Electrolytic, TEM and Raman studies on the production of carbon nanotubes in molten NaCl Carbon 41 no 6 (2003) 1127-1141 (DOI: 10.1016/S0008-6223(03)00020-4) |
114 |
WS2 layer formation on multi-walled carbon nanotubes Appl Phys A 76 no 4 (10 Mar 2003) 527-532 (DOI: 10.1007/s00339-002-1539-9) |
115 |
WS2/C nanocomposites reviewed New diamond and frontier carbon technology 13 no 1 (2003) 7-18 |
116 |
The contribution of phonon scattering to high-resolution images measured by off-axis electron holography Ultramicroscopy 98 no 2-4 (Jan 2004) 115-133 (DOI: 10.1016/j.ultramic.2003.08.005) |
117 |
Direct observations of the nucleation and growth of NiSi2 on Si (001) Presented at: Microscopy of semiconducting materials XIII, Cambridge, 31 March-3 April 2003 Submitted to: Microscopy of semiconducting materials, ed A Cullis and PA Midgley, Inst Phys conf ser no 180 (IOPP, Bristol, 2004) p 463-466 |
118 |
Mesoscale simulation and cryo-TEM of nanoscale drug delivery systems Molecular Simulation 30 no 4 (15 April 2004) 239-247 |
119 |
Direct observation of boron nitride nanocage growth by the molecular beam nitridation and liquid-like motion of Fe-B nanoparticles Journal of Materials Chemistry 13 no 10 (23 Sept 2003) 2573-2576 (DOI: 10.1039/b306406a) |
120 |
Near field x-ray lithography simulations for printing fine bridges J Phys D 36 no 20 (21 Oct 2003) 2471-2482 (DOI: 10.1088/0022-3727/36/20/008) |
121 |
Growth of Boron Nitride nanotubes and Iron nanowires from the liquid flow of Fe-B nanoparticles Chemical Physics Letters 387 no 1-3 (21 March 2004) 40-46 (DOI: 10.1016/j.cplett.2004.01.093) |
122 |
22 nm lithography using near field X-rays Presented at: SPIE Microlithography 2003, Santa Clara, 23-28 February 2003 Published in: Emerging lithographic technologies VII, Ed Roxann L Engelstad, Proceedings of the SPIE vol 5037 pt 2 (June 2003) p 622-633 |
123 |
Near field X-ray lithography to 15 nm Presented at: SPIE Microlithography 2004, Santa Clara, 22-27 February 2004 Published in: Emerging lithographic technologies VIII, Ed R Scott Mackay, Proceedings of the SPIE vol 5374 (2004) p 546-557 |
124 |
Hollowing mechanism of zinc sulfide nanowires in vacuum induced by an atomic oxygen beam J Phys Chem B 108 no 28 (15 July 2004) 9631-9637 (DOI: 10.1021/jp0485284) |
125 |
Characterization of field-emission grown tungsten nanowires by transmission electron microscopy Presented at: 8th Asia-Pacific conference on electron microscopy (8APEM), Kanazawa, Japan, 7-11 June 2004 Published in: 8th Asia-Pacific conference on electron microscopy, ed N Tanaka, Y Takano, H Mori, H Seguchi, S Iseki, H Shimada and E Simamura (8APEM Publication Committee, Uchinada, Ishikawa, 2004) p 364-365 |
126 |
Direct observation of boron nitride nanocage growth by the molecular beam nitridation and liquid-like motion of Fe-B nanoparticles Presented at: 8th Asia-Pacific conference on electron microscopy (8APEM), Kanazawa, Japan, 7-11 June 2004 Published in: 8th Asia-Pacific conference on electron microscopy, ed N Tanaka, Y Takano, H Mori, H Seguchi, S Iseki, H Shimada and E Simamura (8APEM Publication Committee, Uchinada, Ishikawa, 2004) p 628-629 |
127 |
Interface properties of iron oxide films Journal of Physics D 37 no 19 (7 Oct 2004) 2720-2725 |
128 |
Binary phase of layered nanotubes Presented at: MRS Fall Meeting, Boston, 26-29 Nov 2001 Published in: Making functional materials with nanotubes, ed P Bernier, P Ajayan, Y Iwasa, P Nikolaev, MRS symposium proceedings vol 706 (MRS, Warrendale, PA, 2002) p 239-244 |
129 |
High spatial resolution strain measurement of deep sub-micron semiconductor devices using CBED Presented at: 11th international symposium on the physical and failure analysis of integrated circuits (IPFA 2004), Science Park, Hsinchu, Taiwan, 5-8 July 2004 Published in: Proceedings of the 11th international symposium on the physical & failure analysis of integrated circuits IPFA 2004, ed Steve S Chung, Alastair Trigg, MD Ker and John Thong (IEEE, 2004) p 143-146 |
130 |
Reduction of local mechanical stress in a transistor using Si3N4/SiOxNy contact ESL Electrochemical and solid state letters 8 no 2 (2005) G38-G40 (DOI: 10.1149/1.1843754) |
131 |
Synthesis of Fe nanoparticles by redox reaction using an electron beam deposition technique Presented at: International conference on materials for advanced technologies, ICMAT 2003, Singapore, 7-12 December 2003 Published in: International journal of nanoscience 3 no 4 & 5 (Aug & Oct 2004) 631-638 (DOI: 10.1142/S0219581X04002462) |
132 |
Influence of Au catalyst on the growth of ZnS nanowires Chemical Physics Letters 400 no 1-3 (11 December 2004) 175-178 (DOI: 10.1016/j.cplett.2004.10.115) |
133 |
Phonon Scattering in High-Resolution Electron Microscopy Presented at: Microscopy & Microanalysis 2005, Honolulu, Hawaii, 31 July-4 August 2005 Published in: Microscopy and Microanalysis 10 suppl SO2 (2005) 554-555 |
134 |
Electronic properties of half metallic Fe3O4 films Journal of Applied Physics 97 no 9 (1 May 2005) 093713-1 to -6 (DOI: 10.1063/1.1889247) |
135 |
In-situ growth of BN nanocages Presented at: Microscopy and Microanalysis 2003, San Antonio, Texas, 3-7 Aug 2003 Published in: Microscopy and Microanalysis 9 Suppl 2 (2003) 914-915
|
136 |
NiGe on Ge(001) by reactive deposition epitaxy: an in-situ ultrahigh-vacuum transmission electron microscopy study Applied Physics Letters 86 no 20 (16 May 2005) 201908-1 to -3 (DOI: 10.1063/1.1929100) |
137 |
Strain analysis in silicon substrates under uniaxial and biaxial stress by convergent beam electron diffraction Journal of vacuum science and technology B 23 no 3 (May/June 2005) 940-946 (DOI: 10.1116/1.1924583) |
138 |
Shape and size control of Ag2Se nanocrystals from single precursor [(Ph3P)3Ag2(SeC{O}Ph)2] Chemical Communications 30 (2005) 3820-3822 (DOI: 10.1039/b506203a) |
139 |
Nanocantilevers made of bent silicon carbide nanowire-in-silicon oxide nanocone Applied Physics Letters 85 no 22 (29 November 2004) 5388-5390 (DOI: 10.1063/1.1828601) |
140 |
Hexagonal close-packed Ni Nanostructures grown on the (001) Surface of MgO Applied Physics Letters 86 no 13 (28 March 2005) 131915-1 to -3 (DOI: 10.1063/1.1890472) |
141 |
Effects of buffer layer on the electronic properties of half-metallic Fe3O4 films Journal of Applied Physics 97 (15 May 2005) 10C312-1 to -3 (DOI: 10.1063/1.1855205) |
142 |
Simulations for printing contacts with near field X-rays Journal of Physics D 38 no 16 (21 August 2005) 2947-2951 (DOI: 10.1088/0022-3727/38/16/031) |
143 |
Quantitative measurement of image intensity in transmission electron microscope images Presented at: International conference on materials for advanced technologies, ICMAT 2005, Singapore, 3-8 July 2005 Published in: Applied surface science 252 no 11 (31 March 2006) 3984-3988 (DOI: 10.1016/j.apsusc.2005.09.031) |
144 |
Effect of Fe2O3 on the transport and magnetic properties of half metallic Fe3O4 Journal of Applied Physics 99 no 8 (15 April 2006) 08J105-1 to -3 (DOI: 10.1063/1.2170981) |
145 |
Growth and structural evolution of nanosized Ni on (001) MgO by in situ TEM Presented at: Microscopy and Microanalysis 2004, Savannah, Georgia, USA, 1-5 August 2004 Published in: Microscopy and Microanalysis 10 (Aug 2004) 272-273 |
146 |
Characteristics of single metallic nanowire growth via a field-emission induced process Journal of Applied Physics 99 no 6 (15 March 2006) 064309-1 to 12 (DOI: 10.1063/1.2181281) |
147 |
Measurement of focal spread, beam divergence and vibration in HREM images Presented at: 16th international microscopy congress, Sapporo, Japan, 3-8 September 2006 Published in: Proceedings of the sixteenth international microscopy congress, volume 2, ed Hideki Ichinose and Takahisa Sasaki (Publication committee of IMC16, 2006) p 640 |
148 |
The phonon contribution to diffraction patterns Presented at: 16th international microscopy congress, Sapporo, Japan, 3-8 September 2006 Published in: Proceedings of the sixteenth international microscopy congress, volume 2, ed Hideki Ichinose and Takahisa Sasaki (Publication committee of IMC16, 2006) p 992 |
149 |
Direct observation of single-walled carbon nanotube growth at the atomistic scale Nano Letters 6 no 3 (March 2006) 449-452 (DOI: 10.1021/nl052356k) |
150 |
High spatial resolution mapping of strain induced by the geometry configuration in nanoscaled devices Presented at: 207th meeting of the Electrochemical Society, Quebec, Canada, 15-20 May 2005 Published in: Meeting abstracts of the Electrochemical Society 501 (2006) 670 |
151 |
One pot synthesis of new phase AgInSe2 nanorods Journal of the Americal Chemical Society 128 no 22 (7 June 2006) 7118-7119 (DOI: 10.1021/ja060543u) |
152 |
The growth mechanism and field emission properties of single carbon nanotips Nanotechnology 17 no 15 (14 Aug 2006) 3655-3661 (DOI: 10.1088/0957-4484/17/15/006) |
153 |
Evaluation of the strain state in SiGe/Si heterostructures by high resolution X-ray diffraction and convergent beam electron diffraction Presented at: 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2005, Singapore, 27 June - 1 July 2005 Published in: Physical and Failure Analysis of Integrated Circuits, 2005, ed ? (IEEE, 2005) p 302-305 (DOI: 10.1109/IPFA.2005.1469184) |
154 |
Directed wiring of zinc oxide nanowires Presented at: International Congress of Nanotechnology (ICNT 2005), San Francisco, 31 October - 4 November 2005 Published in: Proceedings of the 2nd International Congress of Nanotechnology 2005, CD ROM (Dec 2005) |
155 |
Microstructural evolution and its influence on magnetic properties of CoFe2O4 powders during mechanical milling Phys Rev B 74 no 18 (Nov 2006) 184427-1 to 10 (DOI: 10.1103/PhysRevB.74.184427) |
156 |
Magnetic and transport properties of Co-doped Fe3O4 films Journal of Applied Physics 101 no 1 (1 Jan 2007) 013904-1 to 6 (DOI: 10.1063/1.2404469) |
157 |
One-step synthesis of titania nanoparticles from PS-P4VP diblock copolymer solution Nanotechnology 18 no 13 (4 April 2007) 135605-1 to -6 |
158 |
Calculating the intensity in electron diffraction patterns Plenary lecture at: 24th Annual conference of the Microscopy Society of Thailand, Kasetsart University, Bangkok, Thailand, 14-16 February 2007 Published in: Journal of Microscopy Society of Thailand 21 no 1 (Feb 2007) 13-14 |
159 |
Size and composition tunable Ag-Au alloy nanoparticles by replacement reactions Nanotechnology 18 no 24 (20 June 2007) 245605-1 to -8 (DOI: 10.1088/0957-4484/18/24/245605) |
160 |
Dynamical observation of bamboo-like carbon nanotube growth Nano Letters 7 no 8 (30 June 2007) 2234-2238 (DOI: 10.1021/nl070681x) |
161 |
Microstructure and magnetotransport properties of Cu doped Fe3O4 films Journal of Applied Physics 103 no 7 (16 Jan 2008) 07F701 (DOI: 10.1063/1.2828504) |
162 |
Controlled chemical stabilization of self-assembled PS-P4VP nanostructures Journal of Colloid and Interface Science 317 issue 1 (1 Jan 2008) 255-263 (DOI: 10.1016/j.jcis.2007.09.044) |
163 |
Silica coating of nanoparticles by sonogel process Langmuir 24 no 3 (5 Aug 2008) 650-653 (DOI: 10.1021/la703872k) |
164 |
A microstructural investigation of Al-doped ZnO films prepared by spray pyrolysis Proceedings of the 25th annual conference of the Microscopy Society of Thailand 2008 (Microscopy Society of Thailand, 2008) 163-164 |
165 |
Site-specific growth of ZnO nanowires from patterned Zn via compatible semiconductor processing Journal of Crystal Growth 310 no 10 (1 May 2008) 2485-2492 (DOI: 10.1016/j.jcrysgro.2008.01.012) |
166 |
Influence of As4 flux on the growth kinetics, structure and optical properties of InAs/GaAs quantum dots Journal of Applied Physics 102 (11 Oct 2007) 073526-1 to -4 (DOI: 10.1063/1.2785969) |
167 |
Understanding and Controlling the Growth of Monodisperse CdS Nanowires in Solution Chemistry of Materials 20 no 16 (26 August 2008) 5444-5452 (DOI: 10.1021/cm8014379) |
168 |
Thermal stability of catalytically grown multi-walled carbon nanotubes observed in transmission electron microscopy Applied Physics A 94 no 2 (Feb 2009) 247-251 (DOI: 10.1007/s00339-008-4765-y) |
169 |
Formation of carbon capsules from an amorphous carbon film by Ga and Ni/Co catalysts in a transmission electron microscope Journal of Materials Research 24 no 4 (4 April 2009) 1388-1394 |
170 |
Synthesis of monodisperse CdS nanowires and their photovoltaic applications Presented at: E-MRS, Strasbourg, 26-30 May 2008 Thin Solid Films 517 (1 Oct 2009) 6430-6434 (DOI: 10.1016/j.tsf.2009.02.054) |
171 |
Controlled synthesis of CdSe and CdTe multi-block heteronanostructures Chemistry of Materials 21 no 8 (28 April 2009) 1465-1470 (DOI: 10.1021/cm802350p) |
172 |
Theoretical and experimental factors affecting measurements of semiconductor mean inner potentials Presented at: Microscopy of semiconducting materials XVI, Oxford, 17-20 March 2009 Published in: Journal of Physics: Conference Series 209 no 1 (2010) 012030 (DOI: 10.1088/1742-6596/209/1/012030) |
173 |
Atomic resolution imaging of in situ InAs nanowire dissolution at elevated temperature Presented at: Microscopy of semiconducting materials XVI, Oxford, 17-20 March 2009 Published in: Journal of Physics: Conference Series 209 no 1 (2010) 012013 (DOI: 10.1088/1742-6596/209/1/012013) |
174 |
Reversibility of Al/Ti modified LiBH4 Journal of Physical Chemistry C 113 no 31 (1 July 2009) 14059-14066 (DOI: 10.1021/jp9031892) |
175 |
Sol-gel nanocoating on commercial TiO2 nanopowder using ultrasound Journal of Sol-Gel Science and Technology 53 no 1 (13 Jan 2010) 115-120 (DOI: 10.1007/s10971-009-2066-3) |
176 |
Synthesis of Ag@AgAu metal core/alloy shell bimetallic nanoparticles with tunable shell compositions by a galvanic replacement reaction Small 4 no 8 (Aug 2008) 1067-1071 (DOI: 10.1002/smll.200701196) |
177 |
Dynamical response of catalytic systems in a CS corrected environmental transmission electron microscope Presented at: Microscopy and Microanalysis 2010, Portland, Oregen, USA, 1-5 August 2010 Published in: Microscopy and Microanalysis 16 Suppl 2 (2010) 292-293 (DOI: 10.1017/S1431927610056230) |
178 |
Dynamical Effects in the Study of Supported Nanocrystals using Electron Holography Presented at: Microscopy and Microanalysis 2010, Portland, Oregen, USA, 1-5 August 2010 Published in: Microscopy and Microanalysis 16 Suppl 2 (2010) 572-573 (DOI: 10.1017/S1431927610057119) |
179 |
Three-dimensional structure of CeO2 nanocrystals Journal of Physical Chemistry C 115 no 9 (10 Mar 2011) 3544-3551 (DOI: 10.1021/jp1122097) |
180 |
Stability studies of CdSe nanocrystals in an aqueous environment Nanotechnology 22 no 27 (8 July 2011) 275706-1 to -5 (DOI: 10.1088/0957-4484/22/27/275706) |
181 |
Microstructural investigation and SnO nanodefects in spray-pyrolyzed SnO2 thin films Materials Letters 65 issue 17-18 (Sept 2011) 2610-2613 (DOI: 10.1016/j.matlet.2011.05.071) |
182 |
Reconstruction of an InAs nanowire using geometric and algebraic tomography Presented at: 17th International Conference on Microscopy of Semiconducting Materials, Cambridge, 4-7 April 2011 Published in: Journal of Physics: Conference Series 326 (2011) 012045 (DOI: 10.1088/1742-6596/326/1/012045) |
183 |
Mapping boron in silicon solar cells using electron energy-loss spectroscopy Presented at: 17th International Conference on Microscopy of Semiconducting Materials, Cambridge, 4-7 April 2011 Published in: Journal of Physics: Conference Series 326 (2011) 012052 (DOI: 10.1088/1742-6596/326/1/012052) |
184 |
Experimental evidence for self-assembly of CeO2 particles in solution: formation of single-crystalline porous CeO2 nanocrystals Journal of Physical Chemistry C 116 no 1 (12 Jan 2012) 242-247 (DOI: 10.1021/jp208340q) |
185 |
Analysis of charge transfer for in situ Li intercalated carbon nanotubes Journal of Physical Chemistry C 116 no 20 (24 May 2012) 11364-11369 (DOI: 10.1021/jp301369u) |
186 |
Transmission electron microscope tomography of nanostructured materials Journal of Nanoengineering and Nanomanufacturing 1 (2011) 257-264 (DOI: 10.1166/jnan.2011.1028) |
187 |
Evolution pathway of CIGSe nanocrystals for solar cell applications Journal of Physical Chemistry C 116 no 14 (12 April 2012) 8202-8209 (DOI: 10.1021/jp300187r) |
188 |
EELS measurements of boron concentration profiles in p-a-Si and nip a-Si solar cells Presented at: 24th International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS), Nara, Japan, 21-26 August 2011 Published in: Journal of Non-Crystalline Solids 358 no 17 (1 Sept 2012) 2179-2182 (DOI: 10.1016/j.jnoncrysol.2011.12.055) |
189 |
Geometric reconstruction methods for electron tomography Ultramicroscopy 128 (May 2013) 42-54 (DOI: 10.1016/j.ultramic.2013.01.002) Preprint: arXiv:1205.5738 |
190 |
In situ HRTEM - image corrected and monochromated Titan equipped with environmental cell Presented at: 14th European Microscopy Congress (EMC 2008), Aachen, Germany, 1-5 September 2008 Published in: EMC 2008 14th European Microscopy Congress, Martina Luysberg, Karsten Tillmann and Thomas Weirich (Springer, Berlin Heidelberg, 2008) 509-510 DOI: 10.1007/978-3-540-85156-1_255 |
191 |
Boron concentration measurements at the I/P interface in NIP a-Si solar cells Presented at: 26th European Photovoltaic Solar Energy Conference and Exhibition (PVSEC), Hamburg, Germany, 5-9 September 2011 Published in: ECN Publications ECN-M-11-022 |
192 |
Direct visualization of the spatial distribution of functional groups in graphene oxide Presented at: EMC 2012 Published in: EMC 2012 Volume 2 Physical Sciences: Tools and Techniques, Edited by DJ Stokes and JL Hutchison (RMS, 2012) |
193 |
Transmission electron microscopy of Co:ZnO magnetic semiconductor Presented at: EMC 2012 Published in: EMC 2012 Volume 2 Physical Sciences: Tools and Techniques, Edited by DJ Stokes and JL Hutchison (RMS, 2012) |
194 |
Surface plasmon mapping of the silver layer in a silicon solar cell using energy-filtered transmission electron microscopy Presented at: EMC 2012 Published in: EMC 2012 Volume 2 Physical Sciences: Tools and Techniques, Edited by DJ Stokes and JL Hutchison (RMS, 2012) |
195 |
Electron holography of dynamical contributions to the phase and amplitude of an InAs nanowire Presented at: EMC 2012 |
196 |
Synthesis of Cu2SnSe3 nanocrystals for solution processable photovoltaic cells Inorganic Chemistry 52 no 4 (18 Feb 2013) 1722-1728 (DOI: 10.1021/ic301141w) |
197 |
Electron energy-loss spectroscopy of boron-doped layers in amorphous thin film silicon solar cells Journal of Applied Physics 113 no 9 (7 March 2013) 093513 |
198 |
Towards understanding the influence of electron-gas interactions on imaging in an environmental TEM Presented at: Microscopy Conference MC 2011, Kiel, Germany, 28 August - 02 September 2011 Published in: Microscopy Conference MC 2011 (German Society for Electron Microscopy, 2011) IM6-614 |
199 |
Direct observation of carbon nanostructures growth using in-situ ultrahigh vacuum transmission electron microscopy Presented at: Nanotech 2007, Santa Clara, 20-24 May 2007 Published in: Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 1 ed Matthew Laudon, Bartlomiej F Romanowicz (CRC Press, 2007) p 21-24 |
200 |
Comparison of approaches and artefacts in the measurement of CCD modulation transfer functions Ultramicroscopy 129 (June 2013) 18-29 (DOI: 10.1016/j.ultramic.2013.03.001) |
201 |
Transmission electron microscopy of the textured silver back reflector of a thin film silicon solar cell: from crystallography to optical absorption Presented at: 26th European Photovoltaic Solar Energy Conference, Hamburg, 5-8 September 2011 Published in: EU PVSEC Proceedings (2011) 2554-2557 |
202 |
Disordered Precipitates in an Al-Mg-Si-Cu-Ag Alloy Published in: International Conference on Aluminium Alloys 12 (2010) p 424-429 |
203 |
Compositional study of defects in microcrystalline silicon solar cells using spectral decomposition in the scanning transmission electron microscope Applied Physics Letters 102 no 13 (April 2013) 133902-1 to -3 (DOI: 10.1063/1.4800569) |
204 |
Chromatic aberration corrected tilt series transmission electron microscopy of a whole mount macrophage cell Microscopy and Microanalysis 19 no 4 (Aug 2013) 814-820 (DOI: 10.1017/S1431927613001475) |
205 |
Advantages of chromatic aberration correction for energy-filtering in the transmission electron microscope Presented at: EDGE 2013, Sainte Maxime, France, 26-31 May 2013 Published in: Enhanced data generated by electrons EDGE 2013 (2013) p T-32 |
206 |
Get more out of EELS spectra: noise reduction, original background-removal functions and component analysis Presented at: Advanced microstructural characterization of nanomaterials, Sevilla, 1-2 July 2013 Published in: Al-NanoFunc workshops 2013 102 (2013) p 17-18 |
207 |
Focused ion beam specimen preparation for electron holography of electrically biased thin film solar cells Presented at: Microscopy conference 2013, Regensburg, Germany, 25-30 August 2013 Published in: Proceedings MC 2013 ed Reinhard Rachel (2013) p 242-243 |
208 |
Ion implantation of graphene - towards IC compatible technologies Nano Letters 13 no 10 (2013) 4902-4907 (DOI: 10.1021/nl402812y) |
209 |
Magnetic properties of ultra-small goethite nanoparticles Journal of Physics D: Applied Physics 47 no 36 (10 Sept 2014) 365003-1 to -13 (DOI: 10.1088/0022-3727/47/36/365003) |
210 |
The origin of high efficiency in low-temperature solution-processable bilayer organometal halide hybrid solar cells Energy & Environmental Science 7 no 1 (1 Jan 2014) 399-407 (DOI: 10.1039/c3ee43161d) |
211 |
Mechanically alloyed β-Ag2Te in thermoelectric Bi2Se0.01Te2.99 Materials Letters 116 (1 Feb 2014) 243-246 (DOI: 10.1016/j.matlet.2013.11.048) |
212 |
Defects in paramagnetic Co-doped ZnO films studied by transmission electron microscopy Journal of Applied Physics 114 (2013) 243503-1 to 6 (DOI: 10.1063/1.4851015) |
213 |
Atomic resolution imaging and spectroscopy of barium atoms and functional groups on graphene oxide Ultramicroscopy 145 (Oct 2014) 66-73 (DOI: 10.1016/j.ultramic.2014.03.004) |
214 |
Opportunities for chromatic aberration corrected high-resolution transmission electron microscopy, lorentz microscopy and electron holography of magnetic minerals Microsc. Microanal. 18 Suppl 2 (2012) 1708-1709 (DOI: 10.1017/S1431927612010392) |
215 |
Plasmonic enhancement at metal atoms on graphene edges revealed by EFTEM Journal of Physics: Conference Series 522 (2014) 012078-1 to -4 (DOI: 10.1088/1742-6596/522/1/012078) |
216 |
Three-wave electron vortex lattices for measuring nanofields Ultramicroscopy 148 (2015) 25-30 (DOI: 10.1016/j.ultramic.2014.08.011) |
217 |
Phase stabilization principle and precipitate-host lattice influences for Al-Mg-Si-Cu alloy precipitates Journal of Materials Science 49 no 18 (1 Sept 2014) 6413-6426 (DOI: 10.1007/s10853-014-8371-4) |
218 |
Understanding the role of single molecular ZnS precursors in the synthesis of InP/ZnS nanocrystals ACS Applied Materials & Interfaces 6 no 20 (22 October 2014) 18233-18242 (DOI: 10.1021/am504988j) |
219 |
Factors affecting phase noise in off-axis electron holography Presented at: 18th International Microscopy Congress, Prague, 7-12 September 2014 Published in: 18th International Microscopy Congress Proceedings ed Pavel Hozak (Czechoslovak Microscopy Society, Prague, 2014) p IT-11-P-1659 |
220 |
Electrostatic potential of single-layer graphene measured using electron holography and ab-initio calculations Presented at: 18th International Microscopy Congress, Prague, 7-12 September 2014 Published in: 18th International Microscopy Congress Proceedings ed Pavel Hozak (Czechoslovak Microscopy Society, Prague, 2014) p IT-11-O-1669 |
221 |
Imaging functional groups in graphene oxide at atomic resolution Presented at: 18th International Microscopy Congress, Prague, 7-12 September 2014 Published in: 18th International Microscopy Congress Proceedings ed Pavel Hozak (Czechoslovak Microscopy Society, Prague, 2014) p MS-2-O-3121 |
222 |
Hybridization of off-axis and inline high-resolution electron holography Presented at: 18th International Microscopy Congress, Prague, 7-12 September 2014 Published in: 18th International Microscopy Congress Proceedings ed Pavel Hozak (Czechoslovak Microscopy Society, Prague, 2014) p IT-11-P-3191 |
223 |
Plasmon tailoring in graphene through Lattice impurities and ad-atoms Presented at: 18th International Microscopy Congress, Prague, 7-12 September 2014 Published in: 18th International Microscopy Congress Proceedings ed Pavel Hozak (Czechoslovak Microscopy Society, Prague, 2014) p MS-2-O-3480 |
224 |
Towards 4-D EEL spectroscopic scanning confocal electron microscopy (SCEM-EELS) optical sectioning on a Cc and Cs double-corrected transmission electron microscope Presented at: 18th International Microscopy Congress, Prague, 7-12 September 2014 Published in: 18th International Microscopy Congress Proceedings ed Pavel Hozak (Czechoslovak Microscopy Society, Prague, 2014) p IT-10-O-2435 |
225 |
Optimising electron holography in the presence of partial coherence and instabilities Ultramicroscopy 151 (April 2015) 37-45 (DOI: 10.1016/j.ultramic.2014.11.019) |
226 |
Hybridization approach to in-line and off-axis (electron) holography for superior resolution and phase sensitivity Scientific Reports 4 (12 Nov 2014) 7020 (DOI: 10.1038/srep07020) |
227 |
Layered transition metal oxyhydroxides as tri-functional electrocatalysts Journal of Materials Chemistry A 3 no 22 (14 June 2015) 11920-11929 (DOI: 10.1039/c5ta02063h) |
228 |
Surface effects on mean inner potentials studied using density functional theory Ultramicroscopy 159 part 1 (Dec 2015) 34-45 (DOI: 10.1016/j.ultramic.2015.07.011) |
229 |
Performance of a direct detection camera for off-axis electron holography Ultramicroscopy 161 (February 2016) 90-97 (DOI: 10.1016/j.ultramic.2015.09.004) |
230 |
Optimising electron holography in the presence of partial coherence and instrument instabilities with conventional and direct detection cameras Presented at: Microscopy & Microanalysis 2015, Portland, Oregon, USA, 2-6 August 2015 Published in: Microscopy and Microanalysis 21 Suppl S3 (August 2015) 1955-1956 (DOI: 10.1017/S1431927615010557) |
231 |
Hybrid electron holography Presented at: Microscopy & Microanalysis 2015, Portland, Oregon, USA, 2-6 August 2015 Microscopy and Microanalysis 21 Suppl S3 (August 2015) 2311-2312 (DOI: 10.1017/S1431927615012337) |
232 |
Atomic-scale insights into 1D and 2D nano-materials Presented at: Electron Microscopy and Analysis Group Conference (EMAG2015), Manchester, UK, 29 June-2 July 2015 Published in: Journal of Physics: Conference Series 644 (12 October 2015) 012021-1 to 012021-6 (DOI: 10.1088/1742-6596/644/1/012021) |
233 |
Separation of thorium ions from wolframite and scandium concentrates using graphene oxide Physical Chemistry Chemical Physics 17 (14 October 2015) 25272-25277 (DOI: 10.1039/C5CP04384K) |
234 |
Anomalous particle size dependence of magnetic relaxation phenomena in goethite nanoparticles Croatica Chemica Acta, 88 no 4 (4 Dec 2015) 481-485 (DOI: 10.5562/cca2753) |
235 |
Layered black phosphorus: strongly anisotropic magnetic, electronic and electron transfer properties Angewandte Chemie 55 3382-3386 (2016) (DOI: 10.1002/anie.201511309) |
236 |
The role of ion exchange in the passivation of In(Zn)P nanocrystals with ZnS To be published in: Scientific Reports |
237 |
Experimental realization of the Ehrenberg-Siday thought experiment Applied Physics Letters 108 no 8 (22 Feb 2016) 083108-1 to 4 (DOI: 10.1063/1.4942462) |
238 |
Interfacial evolution and bond reliability in thermosonic Pd coated Cu wire bonding on aluminum metallization: effect of palladium distribution To be published in: Microelectronics Reliability (2016) |
239 |
Counting vacancies and nitrogen-vacancy centers in detonation nanodiamond To be published in: Nanoscale (2016) (DOI: 10.1039/c6nr01888b) |
240 |
Collective electronic excitations in the ultra violet regime in 2-D and 1-D carbon nanostructures achieved by the addition of foreign atoms Scientific Reports 6 (7 June 2016) 27090 (DOI: 10.1038/srep27090) |
241 |
Recent progress in chromatic aberration corrected high-resolution and lorentz transmission electron microscopy Presented at: 3rd International symposium on advanced microscopy and theoretical calculations, Gifu, Japan, 9-11 May 2012 Published in: AMTC Letters 3 (2012) 72-1 to 2 |
242 |
Elucidating the relationship between crystallo-chemistry and optical properties of CIGS nanocrystals To be published in: Nanotechnology (2016) |