| |
The Dimension 3000 consists of a rigid motorized X-Y stage mounted
on a granite block, and features a beam deflection SPM head and integral,
on-axis video microscope. This system can produce high-resolution,
three-dimensional images by scanning a sharp probe over the sample
surface. This system is ideally suited to imaging large, unbroken
samples such as integrated circuit wafers or data storage disk media.
Both Tapping-mode AFM and Contact-mode AFM can be conducted |
|
